Free Thin-Film Optics Simulator for Multilayer Coatings Calculate reflectance, absorptance, color, fields, and sweeps using the transfer matrix method.
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Bragg Mirror / DBR Calculator

Setup

High-Reflectivity Quarter-Wave Stack

A dielectric Bragg reflector builds a high-reflectance stopband by stacking high-index TiO2 and low-index SiO2 quarter-wave layers on glass.

Why This Design Works

A Bragg reflector stacks alternating quarter-wave layers of high (\(n_H\)) and low (\(n_L\)) index. At the design wavelength λ0 the partial reflections from every interface return in phase, so even small per-interface contrasts add up to near-unity reflectance after a few periods. The high-reflectance stopband width is set by the index contrast, not the pair count — extra pairs only deepen reflectance inside the band.

\[\begin{aligned} d_H &= \frac{\lambda_0}{4 n_H}, \qquad d_L = \frac{\lambda_0}{4 n_L}, \\ \Delta\lambda &\approx \frac{4 \lambda_0}{\pi}\sin^{-1}\!\left(\frac{n_H - n_L}{n_H + n_L}\right) \end{aligned}\]

Quarter-wave thicknesses at normal incidence and the stopband full-width set by index contrast. With \(n_H = 2.35\) (TiO2) and \(n_L = 1.46\) (SiO2) at \(\lambda_0 = 0.550\) μm: \(d_H \approx 0.059\) μm, \(d_L \approx 0.094\) μm, \(\Delta\lambda \approx 0.165\) μm.

Design Sweeps
TiO2 \(d_H\) 0.059 μm
SiO2 \(d_L\) 0.094 μm
Stopband \(\Delta\lambda\) 0.165 μm
Stack
Layer Material n k Thickness (µm) Coherence
Incident
-
A
B
Substrate
-
Results
Reflectance Spectrum
normal incidence
sp R
Electric Field Profile
0.550 μm
Pair-Count Sweep
selected λ R vs N